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Simplifying EMI EMC Trouble shooting

With Vougavent E Field and H Field probes

Frequency coverage from 100 kHz to 3 GHz
LNA for sensitive measurements
Specially designed probe tips for various use cases

EMI (Electromagnetic Interference) near field probes are used to detect and measure high frequency electromagnetic fields in the near field region of a device or system.

Vougavent has designed them to capture and measure the electromagnetic radiations effectively with a broadband frequency response.

The EMI near field probe can be used in a variety of applications, including in the testing and development of electronic devices, in the diagnosis of EMI problems, and in the design of EMI shielding.

The EMI near field probe is an essential tool for anyone working in the field of electromagnetic compatibility, as it allows for the detection and measurement of high frequency electromagnetic fields in the near field region, and can be used to identify and locate sources of EMI which enable cost effective EMC Troubleshooting.

E Field EMI Near field Probes

Model Frequency
EV003G 1MHz to 3 GHz
EH003G 1MHz to 3 GHz

H Field EMI Near field Probes

Model Frequency
HM200M 100 kHz to 100 MHz
HM001G 100 MHz to 1 GHz
HM003G 1 GHz to 3 GHz

Low noise pre amplifier

Model Frequency
LNA003G 10 MHz to 3 GHz
Gain: 20 dB
Input Voltage: 6 – 10VDC